Title :
Using ANOVA in a Microwave Round-Robin Comparison
Author :
Barbe, Kurt ; Van Moer, Wendy ; Rolain, Yves
Author_Institution :
Dept. ELEC, Vrije Univ. Brussel, Brussels
Abstract :
This paper describes a procedure for comparing calibrated nonlinear radio-frequency (RF) measurements performed on a nonlinear device by five different measurement laboratories. The device-under-test is a nonlinear active semiconductor device that is designed to generate a maximum number of harmonic tones. The goal is to obtain a simple, automated method that detects if some laboratory had measurement problems during the measurement campaign. The developed comparison method is based on the analysis of variance (ANOVA) technique.
Keywords :
microwave measurement; semiconductor device testing; ANOVA; analysis-of-variance technique; calibrated nonlinear radio-frequency measurements; harmonic tones; microwave round-robin comparison; nonlinear active semiconductor device; Analysis of variance; Distortion measurement; Instruments; Laboratories; Microwave devices; Microwave measurements; Performance evaluation; Radio frequency; Semiconductor device measurement; Testing; ANOVA; microwave measurements; nonlinear measurements;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547001
