Title :
Microwave noise behaviour of resonant tunnelling diodes
Author :
Kwaspen, J.J.M. ; Heyker, H.C. ; van de Roer, Th G
Author_Institution :
Eindhoven University of Technology, Department of Electrical Engineering, Electronic Devices Group, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
Abstract :
A method to measure the microwave noise properties of double barrier resonant tunnelling (DBRT) diodes is described. The noise figure and noise measure of (nonoscillating) DBRT diodes were measured over the full positive and negative bias voltage range, in the 1-1.6 GHz frequency band. The results classify DBRT diodes as low noise devices.
Keywords :
Acoustical engineering; Diodes; Frequency measurement; Microwave devices; Microwave measurements; Microwave theory and techniques; Noise figure; Noise measurement; Resonant tunneling devices; Voltage;
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
