DocumentCode :
1906798
Title :
Cross-field amplifier end-hat effects and 3-D electron density measurements
Author :
Ye, J. ; Chan, C. ; MacGregor, R. ; Ruden, T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear :
1993
fDate :
7-9 June 1993
Firstpage :
79
Abstract :
Summary form only given. A low-frequency, injected-beam, non-reentrant CFA (crossed-field amplifier) has been constructed for experimental investigations of electron-radio frequency wave interactions. In situ 3-D electron density profile measurements have been made to study the end-hat space-charge region of the CFA. It has been found that a separated electron population exists in that region and is detached from the main beam when the end-hats are biased positively with respect to the sole. An investigation into the vacuum electric field profile and the overall device performance versus end-hat bias has suggested that such electron population may be caused by a redistribution of the beam electrons by the axial and radial end-hat electric field.
Keywords :
audio-frequency amplifiers; 3-D electron density profile measurements; axial electric field; beam electron redistribution; cross-field amplifier end-hat effects; device performance; electron-radio frequency wave interactions; end-hat space-charge region; low frequency injected beam nonreentrant crossed field amplifier; main beam; positive bias; separated electron population; vacuum electric field profile; Cutoff frequency; Density measurement; Electric variables measurement; Electron beams; Klystrons; Laboratories; Magnetic devices; Magnetic separation; Particle beams; Physics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1993. IEEE Conference Record - Abstracts., 1993 IEEE International Conference on
Conference_Location :
Vancouver, BC, Canada
ISSN :
0730-9244
Print_ISBN :
0-7803-1360-7
Type :
conf
DOI :
10.1109/PLASMA.1993.593025
Filename :
593025
Link To Document :
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