DocumentCode :
1906810
Title :
Multiprocessor design verification for the PowerPC 620 microprocessor
Author :
Montemayor, Carlos ; Sullivan, Marie ; Yen, Jen-Tien ; Wilson, Pete ; Evers, Richard
Author_Institution :
Motorola Inc., Austin, TX, USA
fYear :
1995
fDate :
2-4 Oct 1995
Firstpage :
188
Lastpage :
195
Abstract :
Multiprocessor design verification for the PowerPC 620 microprocessor was challenging due to the 620 Bus protocol complexity. The highly concurrent bus and level 2 (LS) cache interfaces, and the extensive system configurability. In order to verify this functionality, a combination of random and deterministic approaches were used. The Random Test Program Generator (RTPG) and the newly developed Stochastic Concurrent Program Generator (SCPG) tools were used for random verification. In the deterministic front, testcases in C were written to verify specific scenarios. In creating SCPG, we dealt with the design complexity and frequent design changes by abstracting areas of concern as simple languages, writing tools to generate tests, and executing these in the standard verification environment. The added value of these tests is that they exercise true data sharing among processors, are self-checking and resemble commercial multiprocessor code
Keywords :
automatic testing; built-in self test; formal verification; logic CAD; logic testing; microprocessor chips; system buses; 620 Bus protocol complexity; C; PowerPC 620 microprocessor; Random Test Program Generator; Stochastic Concurrent Program Generator; cache interfaces; concurrent bus; data sharing; design complexity; deterministic approach; multiprocessor code; multiprocessor design verification; random verification; self-checking; system configurability; Automatic programming; Automatic testing; Law; Legal factors; Microprocessors; Multitasking; Protocols; State-space methods; Stochastic processes; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1995. ICCD '95. Proceedings., 1995 IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-8186-7165-3
Type :
conf
DOI :
10.1109/ICCD.1995.528809
Filename :
528809
Link To Document :
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