Title :
Common test data language and tools improve quality and reduce cost
Author :
McKinstry, David M.
Author_Institution :
Texas Instrum. Ltd., Lewisville, TX, USA
Abstract :
Parametric test data have been used for years to improve both product design and manufacturing processes. Historically these data have been program specific and have required teams of specialists. Different programs would have different methods of gathering and managing the data. Different people could analyze the same data with different custom tools and come up with different results. Recently we have been using a common test data exchange language to enable common tools and analysis methods. This data language, a precursor to proposed IEEE Standard 1389, has been successfully deployed to several different programs. Each program has its own test equipment, procedures, and goals for data analysis. Yet all programs have benefited from the common test data language and tools
Keywords :
automatic test software; data analysis; military computing; optimisation; printed circuit testing; production testing; IEEE Standard 1389; Texas Instruments; US Defense; common test data exchange language; common tools; cost; data analysis; manufacturing processes; optimisation; parametric test data; product design; product testing; Costs; Data analysis; Data engineering; Design engineering; Independent component analysis; Instruments; Manufacturing processes; Memory; Product design; Testing;
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
DOI :
10.1109/AUTEST.1997.633674