• DocumentCode
    1907295
  • Title

    Common test data language and tools improve quality and reduce cost

  • Author

    McKinstry, David M.

  • Author_Institution
    Texas Instrum. Ltd., Lewisville, TX, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    544
  • Lastpage
    550
  • Abstract
    Parametric test data have been used for years to improve both product design and manufacturing processes. Historically these data have been program specific and have required teams of specialists. Different programs would have different methods of gathering and managing the data. Different people could analyze the same data with different custom tools and come up with different results. Recently we have been using a common test data exchange language to enable common tools and analysis methods. This data language, a precursor to proposed IEEE Standard 1389, has been successfully deployed to several different programs. Each program has its own test equipment, procedures, and goals for data analysis. Yet all programs have benefited from the common test data language and tools
  • Keywords
    automatic test software; data analysis; military computing; optimisation; printed circuit testing; production testing; IEEE Standard 1389; Texas Instruments; US Defense; common test data exchange language; common tools; cost; data analysis; manufacturing processes; optimisation; parametric test data; product design; product testing; Costs; Data analysis; Data engineering; Design engineering; Independent component analysis; Instruments; Manufacturing processes; Memory; Product design; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633674
  • Filename
    633674