DocumentCode :
1907340
Title :
On the question of desired sensitivity assurance when testing linear systems by small number of test patterns
Author :
Geurkov, Vadim
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont., Canada
Volume :
1
fYear :
2002
fDate :
2002
Firstpage :
538
Abstract :
A testing procedure for a linear static system with known structure and unknown input signals is examined. Parameters of the system are defined as interval values. If the tolerance on this value is exceeded for a given parameter, the parameter is considered to be "faulty". Only parametric faults are tolerated in the system and a fault multiplicity is less than the total number of parameters. Increments are applied to the unknown input signals to estimate parameter deviations. It is shown how to choose these increments to decrease the "insensitivity" region and to ensure desired sensitivity to parameter deviations. For a small value of the fault multiplicity the number of test patterns/experiments is also small.
Keywords :
automatic testing; fault diagnosis; fault tolerance; linear network analysis; linear systems; parameter estimation; sensitivity; desired sensitivity assurance; fault multiplicity; input signals; insensitivity region; linear static system structure; linear systems testing; mixed-signal systems; parameter deviation estimation; parameter deviation sensitivity; parameter tolerance; parametric faults; self-testing; system parameters; test patterns; testing procedure; Automatic testing; Built-in self-test; Costs; Equations; Linear systems; Parameter estimation; Reliability; Sequential analysis; System testing; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2002. IEEE CCECE 2002. Canadian Conference on
ISSN :
0840-7789
Print_ISBN :
0-7803-7514-9
Type :
conf
DOI :
10.1109/CCECE.2002.1015284
Filename :
1015284
Link To Document :
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