• DocumentCode
    1907340
  • Title

    On the question of desired sensitivity assurance when testing linear systems by small number of test patterns

  • Author

    Geurkov, Vadim

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont., Canada
  • Volume
    1
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    538
  • Abstract
    A testing procedure for a linear static system with known structure and unknown input signals is examined. Parameters of the system are defined as interval values. If the tolerance on this value is exceeded for a given parameter, the parameter is considered to be "faulty". Only parametric faults are tolerated in the system and a fault multiplicity is less than the total number of parameters. Increments are applied to the unknown input signals to estimate parameter deviations. It is shown how to choose these increments to decrease the "insensitivity" region and to ensure desired sensitivity to parameter deviations. For a small value of the fault multiplicity the number of test patterns/experiments is also small.
  • Keywords
    automatic testing; fault diagnosis; fault tolerance; linear network analysis; linear systems; parameter estimation; sensitivity; desired sensitivity assurance; fault multiplicity; input signals; insensitivity region; linear static system structure; linear systems testing; mixed-signal systems; parameter deviation estimation; parameter deviation sensitivity; parameter tolerance; parametric faults; self-testing; system parameters; test patterns; testing procedure; Automatic testing; Built-in self-test; Costs; Equations; Linear systems; Parameter estimation; Reliability; Sequential analysis; System testing; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2002. IEEE CCECE 2002. Canadian Conference on
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-7514-9
  • Type

    conf

  • DOI
    10.1109/CCECE.2002.1015284
  • Filename
    1015284