Title :
Limitations of Digital CMOS-Processes for Analog Applications due to Channel Length Modulation and Hot Carrier Degradation
Author :
Steimle, M. ; Muhlhoff, H.-M.
Author_Institution :
Siemens AG, Semiconductor Division, Munich, Germany
Keywords :
Analog circuits; Degradation; Digital circuits; Digital modulation; Hot carriers; MOS devices; MOSFETs; Mirrors; Stress; Voltage;
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
