Title :
Overlapping cluster planarity
Author :
Didimo, Walter ; Giordano, Francesco ; Liotta, Giuseppe
Author_Institution :
Dipt. di ingegneria Elettronica e dell´´lnformazione, Univ. degli Studi di Perugia
Abstract :
Cluster planarity is currently recognized as one of the most interesting problem in graph drawing. This paper investigates a new direction in this area by addressing the following question: let G be a graph along with a hierarchy of vertex clusters, where clusters can partially intersect. Does G admit a drawing where each cluster is inside a simple closed region, no two edges intersect, and no edge intersects a region twice? We investigate the interplay between this problem and the classical cluster planarity testing problem where clusters are not allowed to partially intersect. Characterizations, models, and algorithms are discussed.
Keywords :
computational geometry; data visualisation; graph theory; pattern clustering; cluster planarity testing problem; graph drawing; graph visualisation; Biology computing; Clustering algorithms; Computer networks; Data visualization; IP networks; Knowledge engineering; Reverse engineering; Semiconductor device modeling; Social network services; Testing;
Conference_Titel :
Visualization, 2007. APVIS '07. 2007 6th International Asia-Pacific Symposium on
Conference_Location :
Sydney, NSW
Print_ISBN :
1-4244-0808-3
Electronic_ISBN :
1-4244-0809-1
DOI :
10.1109/APVIS.2007.329278