DocumentCode :
1908098
Title :
High Capacitance Isolated Surrounding Stacked Trench Cell For Advanced DRAMs
Author :
Hofmann, F. ; Hänsch, W. ; Geib, H. ; Rösner, W. ; Takacs, D. ; Risch, L.
Author_Institution :
Siemens AG, Corporate Research and Development, 8 Munich 83
fYear :
1991
fDate :
16-19 Sept. 1991
Firstpage :
359
Lastpage :
362
Abstract :
High density trench type memory cells have been fabricated with silicon islands formed by a grid of trenches. The thin poly-silicon capacitor electrodes surround almost the total cell area and are isolated from the substrate. Due to the large capacitor area very high cell capacitances can be achieved which makes this cell concept shrinkable up to the 256M-DRAM generation.
Keywords :
Capacitance; Capacitors; Dielectrics; Doping; Electrodes; Etching; Microelectronics; Oxidation; Random access memory; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
Print_ISBN :
0444890661
Type :
conf
Filename :
5435309
Link To Document :
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