Title :
Prediction of field-emission array drive characteristics from single-tip I-V data
Author :
Patterson, D.E. ; Zollars, B.G. ; Durrett, M.G.
Author_Institution :
Extreme Devices Inc., Austin, TX, USA
Abstract :
In this paper, we reports on the analysis of emission data collected from a set of single emitter cathodes and uses the results of the analysis to predict the expectation value of the I-V characteristics of a multi-emitter array with an integral resistive layer.
Keywords :
cathodes; field emitter arrays; field-emission array drive properties; integral resistive layer; multi-emitter array; single emitter cathodes; single-tip I-V properties; Cathodes; Circuits; Data analysis; Electrical resistance measurement; Equations; Field emitter arrays; Information geometry; Resistors; Testing; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
DOI :
10.1109/IVMC.2003.1223000
