• DocumentCode
    1908179
  • Title

    Hysteresis and critical phenomena in silicon on insulator MOSFET´s

  • Author

    Ouisse, T. ; Ghibaudo, G. ; Brini, J. ; Cristoloveanu, S. ; Borel, G.

  • Author_Institution
    Thomson-TMS, BP 123, 38521 Saint-Egrÿve Cedex, France
  • fYear
    1991
  • fDate
    16-19 Sept. 1991
  • Firstpage
    349
  • Lastpage
    352
  • Abstract
    An analytical model is proposed to account for the floating body effects in silicon on insulator MOSFET´s. It enables a quantitative description of the hysteresis effects in the static characteristics and explains the correlation between the conductance and transconductance. Experimental data illustrate the occurrence of the negative conductance/transconductance and suggest that a critical phenomenon comparable to a second order phase transition takes place.
  • Keywords
    Analytical models; Capacitance; Equations; Hysteresis; Insulation; Microelectronics; Semiconductor device modeling; Silicon on insulator technology; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
  • Conference_Location
    Montreux, Switzerland
  • Print_ISBN
    0444890661
  • Type

    conf

  • Filename
    5435311