DocumentCode
1908179
Title
Hysteresis and critical phenomena in silicon on insulator MOSFET´s
Author
Ouisse, T. ; Ghibaudo, G. ; Brini, J. ; Cristoloveanu, S. ; Borel, G.
Author_Institution
Thomson-TMS, BP 123, 38521 Saint-Egrÿve Cedex, France
fYear
1991
fDate
16-19 Sept. 1991
Firstpage
349
Lastpage
352
Abstract
An analytical model is proposed to account for the floating body effects in silicon on insulator MOSFET´s. It enables a quantitative description of the hysteresis effects in the static characteristics and explains the correlation between the conductance and transconductance. Experimental data illustrate the occurrence of the negative conductance/transconductance and suggest that a critical phenomenon comparable to a second order phase transition takes place.
Keywords
Analytical models; Capacitance; Equations; Hysteresis; Insulation; Microelectronics; Semiconductor device modeling; Silicon on insulator technology; Threshold voltage; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location
Montreux, Switzerland
Print_ISBN
0444890661
Type
conf
Filename
5435311
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