DocumentCode
1908250
Title
Atomistic modeling of the thermoelectric power factor in ultra-scaled Silicon nanowires
Author
Paul, Abhijeet ; Klimeck, Gerhard
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2010
fDate
13-14 June 2010
Firstpage
1
Lastpage
2
Abstract
Dimensional scaling provides an alternative route to improve the thermoelectric figure of merit (ZT) by the reduction of the lattice thermal conductivity(κl). However, this method is reaching the scaling limit. Further improvement in ZT can be achieved by improving the thermoelectric power-factor (S2G), the numerator of ZT. In this work we study this part of ZT using a combination of semi-empirical Tight-Binding method and Landauer approach. We study the effect of cross-sectional confinement, wire orientation and uniaxial strain on the power-factor (PF). It is found that any improvement in PF is only achieved for wires with cross-section size less than 6nm × 6nm.
Keywords
nanowires; power factor; silicon; thermal conductivity; thermoelectric power; tight-binding calculations; Landauer approach; Si; atomistic modeling; combination; cross-section size; cross-sectional confinement effect; dimensional scaling; lattice thermal conductivity reduction; scaling limit; semiempirical tight-binding method; thermoelectric figure of merit; thermoelectric power factor; ultrascaled silicon nanowires; uniaxial strain; wire orientation; Conductivity; Nanowires; Silicon; Thermal conductivity; Uniaxial strain; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop (SNW), 2010
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-7727-2
Electronic_ISBN
978-1-4244-7726-5
Type
conf
DOI
10.1109/SNW.2010.5562583
Filename
5562583
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