Title :
Noise analysis in devices under non-linear operation
Author :
Cappy, Alain ; Dannevielle, F. ; Dambrine, Gilles
Author_Institution :
IEMN, France
fDate :
22-24 September 1997
Keywords :
Circuit noise; Frequency; Impedance; Low-frequency noise; Microscopy; Noise figure; Oscillators; Phase noise; Steady-state; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194385
