DocumentCode
1908385
Title
Experimental measurements of surface mount component lead stiffness
Author
Pope, D.E. ; Byrd, K.
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
934
Abstract
An approach to the experimental determination of lead stiffness (the straddle board method) has been used to assess surface-mount package leads of actual service dimensions. Correlation was observed between the experimental data and trends of predicted values from the linear elastic beam model. However, the simplified model cannot be used to predict actual performance. Current 3D finite-element analysis shows good correlation and predictive capability. Lead stiffness values of PLCC (plastic leaded chip carrier), cerquad (ceramic quad flat pack), and PQFP (plastic quad flat pack) packages have been measured. Transverse values exceed lateral for PLCC and cerquad packages. Cerquad packages exhibit lower stiffness than PLCC. This behavior can be attributed to the longer shoulder length of the cerquad lead and thinner lead thickness, which offsets the effect of the elastic modulus. PQFP leads are in order of magnitude more compliant than the 50-mil pitch J-lead configuration due to the smaller lead cross section and the gull-wing configuration. The board-level solder-joint reliability of PQFP packages is expected to exceed that of the established PLCC component because of the increased lead compliancy
Keywords
bending; elastic hysteresis; integrated circuit technology; surface mount technology; 3D finite-element analysis; J-lead configuration; PLCC; PQFP; SMD package leads; SMT; board-level solder-joint reliability; ceramic quad flat pack; elastic modulus; experimental data; gull-wing configuration; lead stiffness; lead thickness; linear elastic beam model; plastic leaded chip carrier; plastic quad flat pack; straddle board method; surface mount component; Ceramics; Electronic packaging thermal management; Finite element methods; Lead; Materials science and technology; Plastic packaging; Sliding mode control; Soldering; Testing; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122301
Filename
122301
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