Title :
Theoretical analysis of enhanced field electron emission from the triple junction
Author :
Chung, M.S. ; Yoon, B.-G. ; Cutler, P.H. ; Miskovsky, N.M.
Author_Institution :
Dept. of Phys., Ulsan Univ., South Korea
Abstract :
An electric field enhancement has been often observed at the triple junction of metal-dielectric-vacuum. It yields the enhanced field emission current or the vacuum insulation breakdown.
Keywords :
dielectric materials; electric breakdown; electron field emission; numerical analysis; enhanced field electron emission current; metal-dielectric-vacuum structure; theoretical analysis; triple junction; vacuum insulation breakdown; Boundary conditions; Dielectrics and electrical insulation; Electric breakdown; Electric potential; Electron emission; Geometry; Laplace equations; Physics; Vacuum breakdown; Virtual manufacturing;
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
DOI :
10.1109/IVMC.2003.1223013
