DocumentCode
1908804
Title
Monte Carlo study on electron transport properties in double-gate fully depleted SOI-MOSFETs
Author
Gámiz, F. ; Roldán, J.B. ; López-Villanueva, J.A. ; Carceller, J.E.
Author_Institution
Universidad de Granada, Spain
fYear
1997
fDate
22-24 September 1997
Firstpage
208
Lastpage
211
Keywords
Acoustic scattering; Carrier confinement; Electron mobility; MOSFETs; Monte Carlo methods; Phonons; Rough surfaces; Semiconductor films; Silicon on insulator technology; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN
2-86332-221-4
Type
conf
DOI
10.1109/ESSDERC.1997.194402
Filename
1503332
Link To Document