DocumentCode
1908897
Title
A new technique for testing TAB-LSIs in gigahertz frequency range
Author
Kon, Taichi ; Sasaki, Shinichi ; Konno, Riyo
Author_Institution
NTT Appl. Electron. Lab., Tokyo, Japan
fYear
1990
fDate
20-23 May 1990
Firstpage
949
Abstract
A novel testing technique for TAB (tape-automated-bonding) LSIs operating in the gigahertz-frequency range is described. A TAB tape is sandwiched between test tools in order to compose a stripline configuration during testing. This technique allows the testing frequency range to be dramatically extended by reducing reflection noise caused by impedance mismatch between the test leads and the test sets. Maximum testing bit rate reaches 5 Gb/s, which is 2.5 times greater than that of the conventional technique
Keywords
digital integrated circuits; integrated circuit testing; large scale integration; tape automated bonding; test equipment; 5 Gbit/s; TAB tape; TAB-LSIs; digital IC; gigahertz frequency range; stripline configuration; tape-automated-bonding; testing technique; Acoustic reflection; Bonding; Crosstalk; Frequency; Impedance; Insulation; Insulator testing; Large scale integration; Noise reduction; Propagation delay;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122303
Filename
122303
Link To Document