Title :
A new technique for testing TAB-LSIs in gigahertz frequency range
Author :
Kon, Taichi ; Sasaki, Shinichi ; Konno, Riyo
Author_Institution :
NTT Appl. Electron. Lab., Tokyo, Japan
Abstract :
A novel testing technique for TAB (tape-automated-bonding) LSIs operating in the gigahertz-frequency range is described. A TAB tape is sandwiched between test tools in order to compose a stripline configuration during testing. This technique allows the testing frequency range to be dramatically extended by reducing reflection noise caused by impedance mismatch between the test leads and the test sets. Maximum testing bit rate reaches 5 Gb/s, which is 2.5 times greater than that of the conventional technique
Keywords :
digital integrated circuits; integrated circuit testing; large scale integration; tape automated bonding; test equipment; 5 Gbit/s; TAB tape; TAB-LSIs; digital IC; gigahertz frequency range; stripline configuration; tape-automated-bonding; testing technique; Acoustic reflection; Bonding; Crosstalk; Frequency; Impedance; Insulation; Insulator testing; Large scale integration; Noise reduction; Propagation delay;
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
DOI :
10.1109/ECTC.1990.122303
