DocumentCode
1909157
Title
Self-Aligned AlGaAs/GaAs HBT´s with Tungsten N and P Type Ohmic Contacts
Author
Launay, P. ; Bamueni, B. ; Duchenois, A.M. ; Blanconnier, R.
Author_Institution
Centre National d´´Etude des Télécommunications, Laboratoire de bagneux, 196 av. Henri Ravera, 92220 BAGNEUX
fYear
1991
fDate
16-19 Sept. 1991
Firstpage
161
Lastpage
164
Abstract
A self-aligned GaAlAs/GaAs HBT technology with tungsten emitter and base ohmic contacts is presented. The HBT´s layers are grown by MBE, the emitter contact layer is Ga0.35 In0.65 As. A Zinc diffusion allows for contacting the extrinsic base layer. Self-alignment is obtained by the diffusion around the emitter mesa; nitride spacers are used to isolate the intrinsic area during the diffusion process.
Keywords
Conductivity; Diffusion processes; Etching; Gallium arsenide; Heterojunction bipolar transistors; Molecular beam epitaxial growth; Ohmic contacts; Plasma temperature; Tungsten; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location
Montreux, Switzerland
Print_ISBN
0444890661
Type
conf
Filename
5435349
Link To Document