DocumentCode :
1909169
Title :
Heterodimensional field effect transistors for ultra low power applications
Author :
Jian-Qiang Lu ; Hurt, M.J. ; Peatman, W.C.B. ; Shur, M.S.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1998
fDate :
1-4 Nov. 1998
Firstpage :
187
Lastpage :
190
Abstract :
We describe a new class of field effect transistors (FETs) based on a heterodimensional contact between a three-dimensional gate (metal or semiconductor) and a two-dimensional electron gas. The heterodimensional FET family (2D MESFET, 2DI MESFET, and 2D JFET) has shown significant promise for future high speed, ultra low power applications. We review the recent developments, and report on a new fully ion implanted quasi-heterodimensional FET, the coax-2D JFET.
Keywords :
Schottky gate field effect transistors; ion implantation; junction gate field effect transistors; low-power electronics; two-dimensional electron gas; JFET; MESFET; coax-2D FETs; heterodimensional field effect transistors; ion implanted quasi-heterodimensional FET; three-dimensional gate; two-dimensional electron gas; ultra low power applications; Application software; Circuits; Electrons; FETs; Fabrication; MESFETs; Manufacturing processes; Power engineering and energy; Power engineering computing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1998. Technical Digest 1998., 20th Annual
Conference_Location :
Atlanta, GA, USA
ISSN :
1064-7775
Print_ISBN :
0-7803-5049-9
Type :
conf
DOI :
10.1109/GAAS.1998.722665
Filename :
722665
Link To Document :
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