Title :
Heterodimensional field effect transistors for ultra low power applications
Author :
Jian-Qiang Lu ; Hurt, M.J. ; Peatman, W.C.B. ; Shur, M.S.
Author_Institution :
Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
We describe a new class of field effect transistors (FETs) based on a heterodimensional contact between a three-dimensional gate (metal or semiconductor) and a two-dimensional electron gas. The heterodimensional FET family (2D MESFET, 2DI MESFET, and 2D JFET) has shown significant promise for future high speed, ultra low power applications. We review the recent developments, and report on a new fully ion implanted quasi-heterodimensional FET, the coax-2D JFET.
Keywords :
Schottky gate field effect transistors; ion implantation; junction gate field effect transistors; low-power electronics; two-dimensional electron gas; JFET; MESFET; coax-2D FETs; heterodimensional field effect transistors; ion implanted quasi-heterodimensional FET; three-dimensional gate; two-dimensional electron gas; ultra low power applications; Application software; Circuits; Electrons; FETs; Fabrication; MESFETs; Manufacturing processes; Power engineering and energy; Power engineering computing; Systems engineering and theory;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1998. Technical Digest 1998., 20th Annual
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-5049-9
DOI :
10.1109/GAAS.1998.722665