DocumentCode :
1909188
Title :
Asymmetric gate oxide Tunnel Field Effect Transistor for improved circuit performance
Author :
Narang, Rakhi ; Saxena, Manoj ; Gupta, R.S. ; Gupta, Mridula
Author_Institution :
Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
fYear :
2012
fDate :
15-16 March 2012
Firstpage :
284
Lastpage :
287
Abstract :
This work presents the performance evaluation of an asymmetric gate oxide Double Gate Tunnel Field Effect Transistor (DG-TFET) based on the concept of Heterogeneous Dielectric with a high-k material at the source side and low-k at the drain end. But, in order to improve the performance further, the low-k oxide material (SiO2) at the drain end is replaced with air (k=1) to alleviate the problem of high gate drain capacitance, thus providing improved cut-off frequency, circuit performance in terms of inverter propagation delay and suppressed ambipolar behavior.
Keywords :
field effect transistors; high-k dielectric thin films; silicon compounds; tunnel transistors; DG-TFET; SiO2; asymmetric gate oxide; double gate tunnel FET; heterogeneous dielectric; high gate drain capacitance; high-k material; inverter propagation delay; low-k oxide material; suppressed ambipolar behavior; tunnel field effect transistor; Atmospheric modeling; Capacitance; Indexes; Lead; Logic gates; Radio frequency; Asymmetric gate oxide; Band-to-Band Tunneling; Double Gate; TFET; propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Systems (ICDCS), 2012 International Conference on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4577-1545-7
Type :
conf
DOI :
10.1109/ICDCSyst.2012.6188721
Filename :
6188721
Link To Document :
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