• DocumentCode
    1909188
  • Title

    Asymmetric gate oxide Tunnel Field Effect Transistor for improved circuit performance

  • Author

    Narang, Rakhi ; Saxena, Manoj ; Gupta, R.S. ; Gupta, Mridula

  • Author_Institution
    Dept. of Electron. Sci., Univ. of Delhi, New Delhi, India
  • fYear
    2012
  • fDate
    15-16 March 2012
  • Firstpage
    284
  • Lastpage
    287
  • Abstract
    This work presents the performance evaluation of an asymmetric gate oxide Double Gate Tunnel Field Effect Transistor (DG-TFET) based on the concept of Heterogeneous Dielectric with a high-k material at the source side and low-k at the drain end. But, in order to improve the performance further, the low-k oxide material (SiO2) at the drain end is replaced with air (k=1) to alleviate the problem of high gate drain capacitance, thus providing improved cut-off frequency, circuit performance in terms of inverter propagation delay and suppressed ambipolar behavior.
  • Keywords
    field effect transistors; high-k dielectric thin films; silicon compounds; tunnel transistors; DG-TFET; SiO2; asymmetric gate oxide; double gate tunnel FET; heterogeneous dielectric; high gate drain capacitance; high-k material; inverter propagation delay; low-k oxide material; suppressed ambipolar behavior; tunnel field effect transistor; Atmospheric modeling; Capacitance; Indexes; Lead; Logic gates; Radio frequency; Asymmetric gate oxide; Band-to-Band Tunneling; Double Gate; TFET; propagation delay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Devices, Circuits and Systems (ICDCS), 2012 International Conference on
  • Conference_Location
    Coimbatore
  • Print_ISBN
    978-1-4577-1545-7
  • Type

    conf

  • DOI
    10.1109/ICDCSyst.2012.6188721
  • Filename
    6188721