• DocumentCode
    1909509
  • Title

    A nonlinear thermal stress analysis of surface mount solder joints

  • Author

    Ozmat, Burhan

  • Author_Institution
    Texas Instrum., Dallas, TX, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    959
  • Abstract
    A set of nonlinear finite-element (FE) cyclic thermal stress analyses of leaded ceramic chip carriers (LCCC) was performed. The FE models included the geometric and elastic compliance effects associated with the LCCC cavity, Kovar lid, copper solder pads and thermal joints, the orthotropic printed wiring board (PWB), and a constraining thermal core. The effect of nonlinear and rate-dependent constitutive characteristics of the solder alloy on the distribution of cyclic stress, strain, and energy-dissipation behavior was studied. It is shown that the inclusion of rate effects in the material behavior has a paramount effect on the stress, strain, and energy-dissipation predictions. The difference is due to the creep relaxation leading to redistribution of the load, which was not predicted by an elastic-plastic material model alone. Acceleration factors were calculated from the results of analyses performed for an accelerated thermal test cycle case and a specific real-life thermal cycle case
  • Keywords
    creep; failure analysis; finite element analysis; soldering; stress analysis; surface mount technology; thermal stresses; Cu solder pads; FE models; Kovar lid; LCCC cavity; SMD; SMT; accelerated thermal test cycle; acceleration factors; constraining thermal core; creep relaxation; cyclic stress; elastic compliance effects; energy-dissipation behavior; failure mechanisms; leaded ceramic chip carriers; material behavior; nonlinear FEA; nonlinear thermal stress analysis; orthotropic PWB; printed wiring board; rate effects; solder alloy; strain; surface mount solder joints; Capacitive sensors; Ceramics; Finite element methods; Iron; Lead; Life estimation; Performance analysis; Soldering; Thermal factors; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122305
  • Filename
    122305