DocumentCode
1909543
Title
Electronic Prognostics for Computer Servers
Author
Urmanov, Aleksey
Author_Institution
Sun MicroSystems Inc., San Diego, CA
fYear
2007
fDate
22-25 Jan. 2007
Firstpage
65
Lastpage
70
Abstract
Electronic prognostics (EP) relates measurable precursors of failures to remaining useful life (RUL) predictions for electronic systems. When used with condition-based maintenance, EP promises to significantly increase the effective mean-time-between system failures (MTBF) by predicting and avoiding system failures (maintenance planned based on condition). Increased MTBF numbers translate into enhanced availability and better operational reliability. This is essential for building highly dependable computing systems. This paper briefly reviews the steps required for achieving successful prognostics. The lessons learned from adopting EP to the previous and current generations of enterprise computing systems have influenced the next generation computer system designs, equipping future systems with more advanced capabilities for electronic prognostics. Sun Microsystems\´ new continuous system telemetry harness (CSTH) coupled with advanced pattern recognition substantially increases component reliability margins and system availability goals while reducing (through improved root cause analysis) costly sources of "no trouble found" events. These "no trouble found" events have become a significant warranty-cost issue for COTS and a sparing-logistics issue for mil spec electronic systems
Keywords
pattern recognition; performance evaluation; remaining life assessment; Sun Microsystems; computer servers; condition-based maintenance; continuous system telemetry harness; dependable computing systems; electronic prognostics; mean-time-between system failures; next generation computer system designs; pattern recognition; remaining useful life predictions; warranty-cost; Availability; Circuit faults; Continuous time systems; Fault detection; Fault tolerance; Fault tolerant systems; Maintenance; Predictive models; Sun; Telemetry;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328047
Filename
4126326
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