• DocumentCode
    1909543
  • Title

    Electronic Prognostics for Computer Servers

  • Author

    Urmanov, Aleksey

  • Author_Institution
    Sun MicroSystems Inc., San Diego, CA
  • fYear
    2007
  • fDate
    22-25 Jan. 2007
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    Electronic prognostics (EP) relates measurable precursors of failures to remaining useful life (RUL) predictions for electronic systems. When used with condition-based maintenance, EP promises to significantly increase the effective mean-time-between system failures (MTBF) by predicting and avoiding system failures (maintenance planned based on condition). Increased MTBF numbers translate into enhanced availability and better operational reliability. This is essential for building highly dependable computing systems. This paper briefly reviews the steps required for achieving successful prognostics. The lessons learned from adopting EP to the previous and current generations of enterprise computing systems have influenced the next generation computer system designs, equipping future systems with more advanced capabilities for electronic prognostics. Sun Microsystems\´ new continuous system telemetry harness (CSTH) coupled with advanced pattern recognition substantially increases component reliability margins and system availability goals while reducing (through improved root cause analysis) costly sources of "no trouble found" events. These "no trouble found" events have become a significant warranty-cost issue for COTS and a sparing-logistics issue for mil spec electronic systems
  • Keywords
    pattern recognition; performance evaluation; remaining life assessment; Sun Microsystems; computer servers; condition-based maintenance; continuous system telemetry harness; dependable computing systems; electronic prognostics; mean-time-between system failures; next generation computer system designs; pattern recognition; remaining useful life predictions; warranty-cost; Availability; Circuit faults; Continuous time systems; Fault detection; Fault tolerance; Fault tolerant systems; Maintenance; Predictive models; Sun; Telemetry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-9766-5
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2007.328047
  • Filename
    4126326