Title :
Using a Precision Bridge for Magnitude and Phase Measurement of a Multiplying DAC with an AC Reference
Author :
Maezawa, Akira ; Gong, Bo ; Waltrip, Bryan ; Fitzpatrick, Gerald ; Wang, Yicheng
Author_Institution :
Quantum Electr. Metrol. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
The Andeen-Hagerling AH2700A Ultra-Precision 50 Hz-20 kHz Capacitance Bridge is used to determine the magnitude and phase errors of Texas Instrument´s DAC8811 16-bit Multiplying DAC. An automated testing method using a USB-SPI interface and LabViewTM to control the DAC is presented. The DAC output magnitude and phase errors are dependent on input code, input frequency, and the input voltage magnitude, and a hypothesis for the dependencies is discussed.
Keywords :
automatic testing; bridge circuits; digital-analogue conversion; phase measurement; AC reference; LabViewTM; USB-SPI interface; automated testing method; capacitance bridge; digital-analogue conversion; magnitude measurement; multiplying DAC; phase measurement; precision bridge; Bridge circuits; Capacitance; Frequency; Instrumentation and measurement; Instruments; Logic circuits; Metrology; Operational amplifiers; Phase measurement; Voltage; Capacitance; capacitance bridge; linearity; multiplying DAC; phase;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547142