• DocumentCode
    1909658
  • Title

    AMHS factors enabling small wafer lot manufacturing in semiconductor wafer fabs

  • Author

    Jimenez, Jesus A. ; Bell, Michael ; Adikaram, Charitha ; Davila, Victoria ; Wright, Robert ; Grosser, Alexander

  • Author_Institution
    Ingram Sch. of Eng., Texas State Univ.-San Marcos, San Marcos, TX, USA
  • fYear
    2010
  • fDate
    5-8 Dec. 2010
  • Firstpage
    2575
  • Lastpage
    2585
  • Abstract
    The automated material handling system (AMHS) may become a critical factor that constrains the capacity of 12-wafer-lot systems. In this paper, AMHS productivity detractors affecting small lot manufacturing are studied, including the track layout, number of vehicles, empty vehicle management rules, number of stockers, stocker capacity, among others. Linked simulation models were developed for the 12-wafer-lot and the 25-wafer-lot systems, using AutoSched AP to simulate wafer processing and AutoMod to simulate the AMHS. The AMHS productivity detractors under study were varied for experimental purposes, and each scenario was quantitatively analyzed. Changes in the factory logistics of the 25-wafer-lot AMHS led to the development of the 12-wafer-lot AMHS, resulting in less congestion around high-throughput areas and faster AMHS delivery speeds. Simulation results showed improved AMHS performance despite the significant increase in the amount of wafer moves per hour caused by 12-wafer-lot manufacturing.
  • Keywords
    factory automation; materials handling; production engineering computing; semiconductor device manufacture; AMHS productivity detractors; AutoSched AP simulation; automated material handling system; empty vehicle management rules; semiconductor wafer fabrication plants; stocker capacity; track layout; wafer lot manufacturing; wafer processing; Layout; Load modeling; Manufacturing; Production facilities; Productivity; Semiconductor device modeling; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference (WSC), Proceedings of the 2010 Winter
  • Conference_Location
    Baltimore, MD
  • ISSN
    0891-7736
  • Print_ISBN
    978-1-4244-9866-6
  • Type

    conf

  • DOI
    10.1109/WSC.2010.5678953
  • Filename
    5678953