DocumentCode :
1909685
Title :
Performance improvement for a wet bench tool
Author :
Kabak, Kamil Erkan ; Heavey, Cathal ; Corbett, Vincent
Author_Institution :
Enterprise Res. Centre, Univ. of Limerick, Limerick, Ireland
fYear :
2010
fDate :
5-8 Dec. 2010
Firstpage :
2586
Lastpage :
2593
Abstract :
Cluster tools are prevalent in wafer fabs. The main reason for this prevalence is that the integration of simple sequential steps together with wafer handling equipment reduces the cost significantly with shared facitilies and smaller foot-prints. This paper analyzes the performance of a wet bench tool in a wet cleaning process by means of a detailed simulation model under different operating factors. The results of the simulation experiments show that through reconfiguration of the recipe sequence types that a 18 % improvement in average hourly throughput can be realised under the same average cycle time.
Keywords :
cleaning; fabrics; pattern clustering; wafer level packaging; average cycle time; cluster tools; detailed simulation model; performance improvement; wafer fabs; wet bench tool; Analytical models; Chemicals; Cleaning; Data models; Robots; Semiconductor device modeling; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2010 Winter
Conference_Location :
Baltimore, MD
ISSN :
0891-7736
Print_ISBN :
978-1-4244-9866-6
Type :
conf
DOI :
10.1109/WSC.2010.5678954
Filename :
5678954
Link To Document :
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