Title :
Monte Carlo comparative study of current-mode noise in Si/Si 1-x Ge x Strained Heterojunctions
Author :
Martín, M.J. ; Pardo, D. ; Velázquez, J.E.
Author_Institution :
DIMES, Delft, The Netherlands
fDate :
22-24 September 1997
Keywords :
Diodes; Doping profiles; Fluctuations; Geometry; Germanium silicon alloys; Heterojunctions; Low-frequency noise; Monte Carlo methods; Silicon germanium; Temperature;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194435
