• DocumentCode
    1909798
  • Title

    A CCD delay line to determine low concentrations of bulk traps in silicon

  • Author

    Toren, W.J. ; Bisschop, J.

  • Author_Institution
    Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands.
  • fYear
    1992
  • fDate
    14-17 Sept. 1992
  • Firstpage
    623
  • Lastpage
    626
  • Keywords
    Charge coupled devices; Charge measurement; Clocks; Contamination; Current measurement; Delay lines; Electron traps; Loss measurement; Pollution measurement; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    0444894780
  • Type

    conf

  • Filename
    5435372
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1909798