• DocumentCode
    1909817
  • Title

    The Exponential Repair Assumption: Practical Impacts

  • Author

    Carter, Charles M. ; Malerich, Anthony W.

  • Author_Institution
    ARINC Eng. Services, LLC, Albuquerque, NM
  • fYear
    2007
  • fDate
    22-25 Jan. 2007
  • Firstpage
    125
  • Lastpage
    130
  • Abstract
    For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability
  • Keywords
    curve fitting; exponential distribution; log normal distribution; maintenance engineering; curve fit; exponential distribution; exponential repair assumption; inflated system reliability; lognormal distribution; repairable systems; system reliability; Aerospace electronics; Automobiles; Availability; Density functional theory; Exponential distribution; Redundancy; Reliability; Software systems; Steady-state; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
  • Conference_Location
    Orlando, FL
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-9766-5
  • Electronic_ISBN
    0149-144X
  • Type

    conf

  • DOI
    10.1109/RAMS.2007.328052
  • Filename
    4126336