DocumentCode
1909817
Title
The Exponential Repair Assumption: Practical Impacts
Author
Carter, Charles M. ; Malerich, Anthony W.
Author_Institution
ARINC Eng. Services, LLC, Albuquerque, NM
fYear
2007
fDate
22-25 Jan. 2007
Firstpage
125
Lastpage
130
Abstract
For repairable systems, we assessed the impact of assuming that the repair follows an exponential distribution versus a lognormal distribution for systems with various ratios of MTBF to MRT and various levels of redundancy. Real repair times, as a rule, generally curve fit to the lognormal distribution. We analyzed the system reliability parameters of R(t), Ao, and MTBDE. We found that reliability was sensitive to low values of the ratio MTBF to MRT, and to moderate and low redundancies. In all cases that displayed a statistically significant difference, the exponential repair assumption inflated system reliability
Keywords
curve fitting; exponential distribution; log normal distribution; maintenance engineering; curve fit; exponential distribution; exponential repair assumption; inflated system reliability; lognormal distribution; repairable systems; system reliability; Aerospace electronics; Automobiles; Availability; Density functional theory; Exponential distribution; Redundancy; Reliability; Software systems; Steady-state; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location
Orlando, FL
ISSN
0149-144X
Print_ISBN
0-7803-9766-5
Electronic_ISBN
0149-144X
Type
conf
DOI
10.1109/RAMS.2007.328052
Filename
4126336
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