DocumentCode :
1909895
Title :
Electronic characterisation of oligomeric thin film transistors
Author :
Salih, AJ. ; Hepburn, A.R. ; Haynes, D.M. ; Marshall, J.M. ; Maud, J.M.
Author_Institution :
University College Swansea
fYear :
1994
fDate :
24-29 July 1994
Firstpage :
641
Lastpage :
641
Keywords :
Chemical analysis; Chemical elements; Chemistry; Doping; Educational institutions; Light emitting diodes; Stability; Thin film transistors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
Type :
conf
DOI :
10.1109/STSM.1994.836018
Filename :
836018
Link To Document :
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