Title :
Small geometry effects on the maximum cutoff frequency of bipolar transistors
Author :
Decoutere, S. ; Deferm, L.
Author_Institution :
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
Abstract :
Small geometry effects on the maximum cutoff frequency will be theoretically analysed to provide a base for the physical understanding of the cutoff frequency degradation by peripheral effects. The study is based on a detailed analysis of the time delay components.
Keywords :
Analytical models; Bipolar transistors; Capacitance; Cutoff frequency; Degradation; Delay effects; Equations; Geometry; Microelectronics; Semiconductor process modeling;
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium
