DocumentCode
1910262
Title
A unified approach to hysteretic and ramp-comparison current controllers
Author
Sepe, Raymond B., Jr.
Author_Institution
Electro Standards Lab. Inc., Cranston, RI, USA
fYear
1993
fDate
2-8 Oct 1993
Firstpage
724
Abstract
Sliding mode controller theory is used to develop a unified perspective on the operation of hysteretic controllers (HCs) and ramp-comparison controllers (RCCs). It is shown that additional insight into the operation and tracking ability of the conventional controllers is possible by treating them as special cases of the sliding mode based controller (SMBC) and applying sliding mode control theory. This is accomplished by resisting the HC and the RCC in terms of their operation inside and outside a boundary layer. In particular, it was shown that, with the proper choice of parameters, the SMBC and the RCC differ solely in their region of nominal operation. Whereas the RCC is typically operated within its boundary layer (linear region), the SMBC is designed for operation both inside (linear region) and outside (switched region) its boundary layer. A SMBC was developed with a performance that is superior to the conventional HC and RCC controllers. The transition between nonlinear and linear control is handled quite naturally by the SMBC. The current controller analysis is performed on a DC motor
Keywords
DC motors; controllers; electric current control; machine control; variable structure systems; DC motor; hysteretic controllers; linear control; linear region; nonlinear control; ramp-comparison current controllers; sliding mode based controller; sliding mode control theory; sliding mode controllers; switched region; switching inverter; tracking ability; DC motors; Hysteresis; Industrial control; Laboratories; Performance analysis; Pulse width modulation; Pulse width modulation inverters; Sliding mode control; State-space methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location
Toronto, Ont.
Print_ISBN
0-7803-1462-X
Type
conf
DOI
10.1109/IAS.1993.298872
Filename
298872
Link To Document