Title :
Data Collection and Reliability Analysis of Aged Electronic Devices
Author :
Soto-Campos, E. ; Marcos-Acevedo, J. ; Fernández-Gómez, S. ; Álvarez-Santos, R.
Author_Institution :
Dept. of Electron. Technol., Vigo Univ.
Abstract :
Our current research is using accelerated life testing as the main tool for the evaluation of the reliability of electronic components. However, accelerated testing does not necessarily reflect the real effect that time has on devices. We have obtained a large sample of passive and active components from a recently upgraded industrial facility. These components have been under uninterrupted service for over 30 years. We have characterized and analyzed them, with the aim of comparing them with commonly used aging models obtained from accelerated testing
Keywords :
electronic equipment testing; electronics industry; life testing; reliability; accelerated life testing; aged electronic devices; data collection; electronic components reliability; industrial facility; reliability analysis; Accelerated aging; Data analysis; Electronic components; Employee welfare; Industrial plants; Life estimation; Life testing; Measurement units; Temperature; Voltage;
Conference_Titel :
Reliability and Maintainability Symposium, 2007. RAMS '07. Annual
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-9766-5
Electronic_ISBN :
0149-144X
DOI :
10.1109/RAMS.2007.328121
