DocumentCode :
1910449
Title :
Influence of thermal heating effect on pulsed DC electromigration result analysis
Author :
Waltz, Patrice ; Arnaud, Lucile ; Tartavel, Gérard ; Lormand, Gérard
Author_Institution :
CEA LETI, France
fYear :
1997
fDate :
22-24 September 1997
Firstpage :
456
Lastpage :
459
Keywords :
Circuit testing; Current density; Electromigration; Frequency; Heating; Metallization; Performance evaluation; Predictive models; Temperature; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
Type :
conf
DOI :
10.1109/ESSDERC.1997.194464
Filename :
1503394
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1910449
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