• DocumentCode
    1910449
  • Title

    Influence of thermal heating effect on pulsed DC electromigration result analysis

  • Author

    Waltz, Patrice ; Arnaud, Lucile ; Tartavel, Gérard ; Lormand, Gérard

  • Author_Institution
    CEA LETI, France
  • fYear
    1997
  • fDate
    22-24 September 1997
  • Firstpage
    456
  • Lastpage
    459
  • Keywords
    Circuit testing; Current density; Electromigration; Frequency; Heating; Metallization; Performance evaluation; Predictive models; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194464
  • Filename
    1503394
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1910449