Title :
A Novel Diffusion Coupled Oxidation Model
Author :
Radi, M. ; Leitner, E. ; Hollensteiner, E. ; Selberherr, S.
Author_Institution :
TU Vienna, Austria
fDate :
22-24 September 1997
Keywords :
Analytical models; Boundary conditions; Chemicals; Deformable models; Microelectronics; Numerical models; Object oriented modeling; Oxidation; Silicon compounds; Stress;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194468