Title :
Orientational Spatial Part Modeling for Fine-Grained Visual Categorization
Author :
Hantao Yao ; Shiliang Zhang ; Fei Xie ; Yongdong Zhang ; Dongming Zhang ; Yu Su ; Qi Tian
Author_Institution :
Key Lab. of Intell. Inf. Process., Inst. of Comput. Technol., Beijing, China
fDate :
June 27 2015-July 2 2015
Abstract :
Although significant success has been achieved in fine-grained visual categorization, most of existing methods require bounding boxes or part annotations for training and test, resulting in limited usability and flexibility. To conquer these limitations, we aim to automatically detect the bounding box and parts for fine-grained object classification. The bounding boxes are acquired by a transferring strategy which infers the locations of objects from a set of annotated training images. Based on the generated bounding box, we propose a multiple-layer Orientational Spatial Part (OSP) model to generate a refined description for the object. Finally, we employ the output of deep Convolutional Neural Network (dCNN) as the feature and train a linear SVM as object classifier. Extensive experiments on public benchmark datasets manifest the impressive performance of our method, i.e., Classification accuracy achieves 63.9% on CUB-200-2011 and 75.6% on Aircraft, which are actually higher than many existing methods using manual annotations.
Keywords :
convolution; image classification; neural nets; support vector machines; OSP model; annotated training images; bounding boxes; classification accuracy; dCNN; deep convolutional neural network; fine-grained object classification; fine-grained visual categorization; flexibility; linear SVM; multiple-layer orientational spatial part; object classifier; object description; objects locations; orientational spatial part modeling; part annotations; transferring strategy; usability; Aircraft; Computational modeling; Feature extraction; Histograms; Testing; Training; Visualization; Fine-Grained Visual Categorization; OSP; dCNN;
Conference_Titel :
Mobile Services (MS), 2015 IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4673-7283-1
DOI :
10.1109/MobServ.2015.56