Title :
Thermal analytical model for analysis of pulsed DC electromigration results
Author :
Waltz, Patrice ; Lormand, Gérard ; Arnaud, Lucile
Author_Institution :
CEA LETI, Grenoble, France
fDate :
22-24 September 1997
Keywords :
Analytical models; Electromigration; Equations; Frequency; Heating; Power system modeling; Temperature; Testing; Thermal resistance; Thermal stresses;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194471
