DocumentCode

1910735

Title

Thermal analytical model for analysis of pulsed DC electromigration results

Author

Waltz, Patrice ; Lormand, Gérard ; Arnaud, Lucile

Author_Institution

CEA LETI, Grenoble, France

fYear

1997

fDate

22-24 September 1997

Firstpage

484

Lastpage

487

Keywords

Analytical models; Electromigration; Equations; Frequency; Heating; Power system modeling; Temperature; Testing; Thermal resistance; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1997. Proceeding of the 27th European

Print_ISBN

2-86332-221-4

Type

conf

DOI

10.1109/ESSDERC.1997.194471

Filename

1503401