• DocumentCode
    1910744
  • Title

    Very short TAT ULSI trial manufacturing line construction

  • Author

    Kato, Shigeki ; Suzuki, Tsuyoshi ; Yamazaki, Kenzo ; Nakamura, Masaru

  • Author_Institution
    LSI Manufacturing Div., NEC Corp., Sagamihara, Japan
  • fYear
    1997
  • fDate
    6-8 Oct 1997
  • Abstract
    The LSI manufacturing division manufactures leading-edge trial products to support the semiconductor business of NEC. As LSI design rules are rapidly becoming finer, short turn-around time (TAT) is becoming an important subject in order to create new products as quickly as possible. Under these circumstances, we established a system of improvement based on total productive maintenance (TPM) to achieve 100% customer satisfaction, with priority on very short TAT and success on the first run
  • Keywords
    ULSI; integrated circuit manufacture; maintenance engineering; quality control; NEC; TAT; ULSI; customer satisfaction; design rules; leading-edge trial products; total productive maintenance; trial manufacturing line construction; Customer satisfaction; Humans; Large scale integration; Lead compounds; Manufacturing; National electric code; Personnel; Semiconductor device manufacture; Total quality management; Ultra large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing Conference Proceedings, 1997 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3752-2
  • Type

    conf

  • DOI
    10.1109/ISSM.1997.664610
  • Filename
    664610