DocumentCode :
1910755
Title :
Possibilities of electron beam nano-meter-scale fabrication of Si(111) using alkyl monolayers
Author :
Yamada, Taro ; Takano, Nao ; Yamada, Keiko ; Yoshitomi, Shuhei ; Inoue, Tomoyuki ; Osaka, Tetsuya
Author_Institution :
Kagani Memorial Lab. for Mater. Sci. & Technol., Waseda Univ., Tokyo, Japan
fYear :
2001
fDate :
2001
Firstpage :
403
Lastpage :
408
Abstract :
A novel process of electron-beam nanometer-scale fabrication on Si(111) wafer surfaces has been proposed on the basis of application of organic monolayers as the ultimately thin patterning media. The monolayers on Si(111) wafer surfaces composed of alkyl groups (Cn H2n+1_) prepared with the Grignard reagents were subjected to electron-beam patterning, and deposition of metals onto the electron-bombarded patterns by immersion into aqueous solutions containing Ni2+ or Cu2+ ions. This entire process has been put into practice successfully as a benchmark test. The strength of alkyl-covered Si(111) surface against the processing environment such as in vacuum and aqueous solutions has been demonstrated
Keywords :
electron beam lithography; elemental semiconductors; monolayers; nanotechnology; organic compounds; silicon; Grignard reagent; Si; Si(111) wafer surface; alkyl group; aqueous solution; electron beam nanometer-scale fabrication; metal deposition; organic monolayer; Atomic beams; Atomic layer deposition; Benchmark testing; Electron beams; Fabrication; Laboratories; Materials science and technology; Nanostructures; Probes; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2001. IEEE-NANO 2001. Proceedings of the 2001 1st IEEE Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-7215-8
Type :
conf
DOI :
10.1109/NANO.2001.966456
Filename :
966456
Link To Document :
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