• DocumentCode
    1911049
  • Title

    Low frequency 1/f noise characterization of advanced CMOS-compatible bipolar junction transistors for technology evaluation

  • Author

    Llinares, P. ; Niel, S. ; Laurens, M. ; Ghibaudo, G. ; Chroboczek, J.A.

  • Author_Institution
    France Telecom - CNET, France and SGS-Thomson, France
  • fYear
    1997
  • fDate
    22-24 September 1997
  • Firstpage
    532
  • Lastpage
    535
  • Keywords
    CMOS technology; Degradation; Frequency; Low-frequency noise; Noise figure; Noise level; Noise reduction; Secondary generated hot electron injection; Surface cleaning; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194483
  • Filename
    1503413
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1911049