DocumentCode :
1911066
Title :
Sequential analysis of resonant tunneling diodes
Author :
Genoe, J. ; Van Hoof, C. ; Borghs, G.
Author_Institution :
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
fYear :
1992
fDate :
14-17 Sept. 1992
Firstpage :
883
Lastpage :
886
Abstract :
In recent years, it has been established that a substantial part of the current through a double barrier resonant tunneling structure is transported by sequential tunneling instead of fully coherent tunneling. The theoretical framework of sequential tunneling is especially attractive since the admittance of the device can be obtained immediately. In order to complete this model we have investigated the frequency behavior of the charging and discharging phenomena in the quantum well. All geometric capacitances and the quantum capacitance [1] have been taken into account in this model.[2]
Keywords :
Admittance; Diodes; Energy states; Frequency; Microelectronics; Quantum capacitance; Resonant tunneling devices; Sequential analysis; Solid modeling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium
Print_ISBN :
0444894780
Type :
conf
Filename :
5435427
Link To Document :
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