DocumentCode
1911102
Title
Interface Properties of Strained InGaAs/InP Quantum Wells Grown by LP-MOVPE
Author
Schwedler, R. ; Gallmann, B. ; Wolter, K. ; Kohl, A. ; Leo, K. ; Kurz, H. ; Juillaguet, S. ; Camassel, J. ; Laurenti, J.P. ; Baumann, F.H.
Author_Institution
Institute of Semiconductor Electronics, RWTH Aachen, FRG
fYear
1992
fDate
14-17 Sept. 1992
Firstpage
891
Lastpage
894
Abstract
We have analysed ultrathin (5-10 monolayers) In1-x Gax As/InP (0.17 ¿ x ¿ 1) quantum wells grown by low-pressure metal organic vapour phase epitaxy using optical spectroscopy and transmission electron microscopy. We find, for all compositions, evidence for a complex interface structure at both the lower and the upper interface. Both originate from interdiffusion of arsenic and phosphorus at growth time. The influence of the interface structure on the optical transition energies is discussed in detail.
Keywords
Electron optics; Epitaxial growth; Geographic Information Systems; Indium gallium arsenide; Indium phosphide; Lattices; Multilevel systems; Optical microscopy; Quantum well devices; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location
Leuven, Belgium
Print_ISBN
0444894780
Type
conf
Filename
5435429
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