Title :
The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77 K
Author :
Biesemans, S. ; Simoen, E. ; Kubicek, S. ; De Meyer, K. ; Claeys, C.
Author_Institution :
IMEC, Belgium
fDate :
22-24 September 1997
Keywords :
Application specific processors; CMOS technology; Cryogenic electronics; Electronics cooling; Implants; Intrusion detection; MOSFETs; Packaging; Performance evaluation; Temperature measurement;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194491
