DocumentCode
1911400
Title
A Study of Stress Diagnosis Support System by Finger Plethysmogram Measurement
Author
Takahashi, Tomohiro ; Kaga, Satoshi ; Minazuki, Akinori ; Hayashi, Hidehiko
Author_Institution
Dept. of Econ., Kushiro Public Univ., Kushiro, Japan
fYear
2012
fDate
20-22 Sept. 2012
Firstpage
168
Lastpage
172
Abstract
In recent years, there has been a significant increase in the number of patients suffering from mood disorders such as manic depression, reaching 1.04 million in 2008. In our modern society, with its multitude of stressors that we encounter on a daily basis, we develop a high risk of developing such disorders, which have come to be known as emodern-day illness´. A characteristic of mental disorders is that there is a risk of developing them at the unconscious level, and even if the patient were to detect the condition, they are difficult to treat. Furthermore, while there are tests that evaluate the level of stress, these tests still have many elements that are arbitrary and subjective between the tester and the patient. Therefore, it is extremely important to be able to objectively assess ones stress levels, as well as to raise awareness of and pay attention to internal signals in order to control the level of risk, and in cases where that risk is found to be high, to create a mechanism which provides medical help. Thus, this study aims to visualize the internal signals through the finger plethysmogram which is affected by stress, develop a system to provide assistance in returning stress to normal levels, and assisting in helping patients manage their own risk levels.
Keywords
medical signal processing; patient diagnosis; patient treatment; plethysmography; emodern-day illness; finger plethysmogram measurement; internal signals; mental disorders; mood disorders; patient treatment; stress diagnosis support system; Fingers; Heart rate variability; Resonant frequency; Stress; Stress measurement; Temperature measurement; Time frequency analysis; arduino; finger plethysmogram; spectral analysis; stress; visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Applied Informatics (IIAIAAI), 2012 IIAI International Conference on
Conference_Location
Fukuoka
Print_ISBN
978-1-4673-2719-0
Type
conf
DOI
10.1109/IIAI-AAI.2012.79
Filename
6337179
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