Title :
A Stress Technique Suitable For The In-Line Reliability Monitoring Of The Hot Carrier Endurance of Sub-0,5um MOSFETs
Author :
Dimitriadis, C. ; Papadas, C. ; Concannon, Ann ; Villani, N. ; Vincent, E. ; Mathewson, A.
Author_Institution :
Inst. of Microelec., NCSR Democritos, Greece
fDate :
22-24 September 1997
Keywords :
Charge carrier processes; Condition monitoring; Distribution functions; Extrapolation; Hot carriers; MOSFET circuits; Research and development; Stress; Substrate hot electron injection; Testing;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194497
