DocumentCode
1911413
Title
A Stress Technique Suitable For The In-Line Reliability Monitoring Of The Hot Carrier Endurance of Sub-0,5um MOSFETs
Author
Dimitriadis, C. ; Papadas, C. ; Concannon, Ann ; Villani, N. ; Vincent, E. ; Mathewson, A.
Author_Institution
Inst. of Microelec., NCSR Democritos, Greece
fYear
1997
fDate
22-24 September 1997
Firstpage
588
Lastpage
591
Keywords
Charge carrier processes; Condition monitoring; Distribution functions; Extrapolation; Hot carriers; MOSFET circuits; Research and development; Stress; Substrate hot electron injection; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN
2-86332-221-4
Type
conf
DOI
10.1109/ESSDERC.1997.194497
Filename
1503427
Link To Document