DocumentCode :
1911626
Title :
Photoluminescence from a normal-mode-coupling semiconductor microcavity
Author :
Gibbs, H.M. ; Khitrova, G. ; Berger, J.D. ; Wick, D.V. ; Nelson, T.R., Jr. ; Koch, S.W. ; Kira, M. ; Jahnke, F.
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
30
Lastpage :
31
Abstract :
Summary form only given. Recently there has been much interest in the photoluminescence (PL) properties of semiconductor microcavities that exhibit normal mode coupling (MNC). When a narrow linewidth quantum well is grown inside a moderately high-finesse microcavity, the exciton-photon coupling results in two peaks in transmission when the cavity resonance and the exciton resonance coincide. When the cavity resonance is detuned above the exciton resonance energy and the microcavity is pumped above the mirror stopband, the PL exhibits a curious thresholdlike behavior: as the carrier density is increased, the upperbranch PL increases rapidly while the lowerbranch PL tends to saturate. This behavior was attributed to the spontaneous buildup of exciton polariton population in a microcavity
Keywords :
excitons; micro-optics; optical resonators; photoluminescence; semiconductor quantum wells; carrier density; cavity resonance; exciton polariton population; exciton resonance; exciton resonance energy; exciton-photon coupling; microcavity; mirror stopband; moderately high-finesse microcavity; narrow linewidth quantum well; normal-mode-coupling semiconductor microcavity photoluminescence; semiconductor microcavities; spontaneous buildup; thresholdlike behavior; Excitons; Frequency; Laser excitation; Microcavities; Nonlinear optics; Optical coupling; Optical pumping; Photoluminescence; Pulse measurements; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-541-2
Type :
conf
DOI :
10.1109/IQEC.1998.680081
Filename :
680081
Link To Document :
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