Losses in active clamped resonant DC-link inverter systems

A detailed investigation of losses in an active clamped resonant DC-link inverter system is presented. To measure the component stress, a one phase test circuit, in which the semiconductor devices are stressed in a way similar to that in real resonant inverter systems, is described. A detailed investigation of semiconductor losses and passive component losses depending on parameters of the resonant tank is given. For the measurements fast switching and low saturation IGBTs were used. A comparison of semiconductor losses in an active clamped resonant DC link inverter and in a hard switched PWM inverter is given