Title :
Analysis techniques for electrical and mechanical power systems
Author :
Hale, Peyton S. ; Arno, Robert G. ; Koval, Don O.
Author_Institution :
Special Missions Office, US Army Corps of Eng., Fort Belvoir, VA, USA
Abstract :
This paper is the first of a series of papers discussing the application and accuracy of different analysis techniques supporting the determination of system availability. This paper identifies and discusses the different analysis techniques currently available and identifies software tools utilizing these techniques. It discusses the fundamental approaches of each tool. There is a need recognized in the power industry to identify and utilize a standard tool to analyze the availability of facilities utilizing electrical, mechanical, and HVAC systems. This paper is the culmination of a 6-month study designed to identify viable analysis techniques and associated software tools available for the application of the techniques. The different approaches discussed in this paper include: Boolean algebra; reliability block diagram; event tree; Monte Carlo; zone branch; FMECA; and cut set
Keywords :
Boolean algebra; Monte Carlo methods; failure analysis; fault trees; power system analysis computing; power system reliability; software packages; BlockSim software package; Boolean algebra; ENRiCO software package; Electric Network Reliability and Cost Optimizer software package; FMECA; HVAC systems; Monte Carlo; RAMP software package; RELEX software package; analysis techniques; cut set; electrical systems; event tree; mechanical, systems; power industry; power system availability; reliability block diagram; software tools; zone branch; Application software; Availability; Frequency estimation; Maintenance; Power engineering and energy; Power system analysis computing; Power system modeling; Power system reliability; Reliability engineering; Software tools;
Conference_Titel :
Industrial and Commercial Power Systems Technical Conference, 2001. Conference Record. Papers Presented at the 2001 Annual Meeting. 2001 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-7055-4
DOI :
10.1109/ICPS.2001.966513