• DocumentCode
    1911934
  • Title

    Performance optimization of multi-core processors using core hopping - thermal and structural

  • Author

    Lingampalli, Sunil ; Mirza, Fahad ; Raman, Thiagarajan ; Agonafer, Dereje

  • Author_Institution
    Univ. Of Texas at Arlington, Arlington, TX, USA
  • fYear
    2012
  • fDate
    18-22 March 2012
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    As the work load on the single core processor increases, its power density and the die temperature increases as well. The increase in the die temperature results in decreased performance, reliability and increased leakage currents and cooling cost. Also, the non-uniform power distribution across the die results in hot spots. In order to decrease the work load and the cooling cost on the single core processor, multi-core processors have been implemented. Multicore Processors also known as Chip Multi Processors (CMP´s). CMPs are processors which contain two or more independent cores on a chip. In CMPs, if one core reaches its critical temperature, the workload is transferred to the other. This phenomenon is termed as core hopping. Core hopping facilitates uniform distribution of the work load among the many cores and leads to improvements in the performance and reliability. The demand for greater performance in applications involving high levels of computing has resulted in many cores being put on a single chip. Every succeeding processor is predicted to hold double the number of cores than the previous one. In this study, core hopping for CMPs is analyzed and the thermal analysis of the chip with core hopping is performed using ANSYS Fluent. The hop sequence is analyzed as a function of chip temperature distribution and a numerical methodology to analyze the coupled thermal and structural integrity of the CMPs is demonstrated.
  • Keywords
    leakage currents; microprocessor chips; multiprocessing systems; reliability; temperature distribution; thermal management (packaging); ANSYS Fluent; CMP; chip multiprocessors; chip temperature distribution; cooling cost; core hopping; die temperature; hop sequence; leakage current; multicore processor; nonuniform power distribution; performance optimization; power density; reliability; single core processor; thermal analysis; Adaptation models; Analytical models; Heating; CMPs; Moore´s law; core;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-1110-6
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2012.6188835
  • Filename
    6188835