• DocumentCode
    1912076
  • Title

    A method to measure heat dissipation from component on PCB

  • Author

    Qi, Zhongwei

  • Author_Institution
    Gen. Electr. Technol. Infrastruct. Healthcare, Waukesha, WI, USA
  • fYear
    2012
  • fDate
    18-22 March 2012
  • Firstpage
    143
  • Lastpage
    149
  • Abstract
    Knowledge of heat dissipation from electronic components is critical input for thermal design in the product development phase. Unfortunately heat loss is not always available to design engineers even when a prototype is available. This paper presents a new method to measure and calculate the component heat dissipation on printed circuit board from a thermal standpoint. Based on the error analysis of the thermal resistance network, an error indicator is defined to account for the interference from nearby heat sources. Different cases are simulated to confirm the effectiveness of the measurement method and the error indicator. Using the error indicator in compensation, measurement error can be reduced greatly. Uncertainty analysis is conducted to assess the error sources from measurements and their impacts to result. Preliminary experiments have been conducted on a mock-up board to prove the concept of this method.
  • Keywords
    cooling; error analysis; printed circuits; thermal management (packaging); thermal resistance; PCB; electronic component; error analysis; error indicator; error source; heat dissipation measurement; heat source; interference; measurement error; mock-up board; printed circuit board; thermal design; thermal resistance network; thermal standpoint; uncertainty analysis; Equations; Heating; Mathematical model; Measurement uncertainty; Temperature measurement; Temperature sensors; Thermistors; Error Indicator; Heat Dissipation Measurement Uncertainty Analysis; Heat Loss Estimation; Thermal Resistance Network;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-1110-6
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2012.6188841
  • Filename
    6188841