DocumentCode :
1912103
Title :
Solder-glass attachment in Cerdip/Cerquad packages: thermally induced stresses and mechanical reliability
Author :
Suhir, E. ; Poborets, B.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
1043
Abstract :
The authors discuss the major requirements for the mechanical properties of solder glasses and ceramics in cerquad flat packages (CQFP) and develop a simple and easy-to-use stress-evaluation model aimed at assessing thermal stresses in the glass seals of ceramic packages. The authors also demonstrate how a probabilistic approach can be applied to ensure low and compressive stresses in the glass seals, and describe the results of qualification tests for the CQFP packages. For a reliable solder glass seal in a hermetic ceramic package, it is recommended that the same material be used for all the ceramic components and that the coefficient of thermal expansion of this material be close and somewhat larger than the coefficient of thermal expansion of the solder glass, especially at low temperatures, when the expected thermally induced stresses are the greatest. It is also important that the sealing be performed at the lowest possible temperature and that the solder glass material possess high fracture toughness, high strain-to-failure, good shock resistance, low Young´s modulus, and good adhesion with ceramics
Keywords :
packaging; reliability; seals (stoppers); soldering; thermal stresses; Cerdip/Cerquad packages; Young´s modulus; adhesion; ceramics; coefficient of thermal expansion; compressive stresses; fracture toughness; glass seals; hermetic ceramic package; mechanical properties; mechanical reliability; qualification tests; sealing; shock resistance; solder glasses; strain-to-failure; stress-evaluation model; thermally induced stresses; Ceramics; Compressive stress; Glass; Mechanical factors; Packaging; Sealing materials; Seals; Temperature; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122315
Filename :
122315
Link To Document :
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